School of Pharmacy

The University of Mississippi

Research Cores

Microscopy and Imaging Center (SEM Core)

Welcome to the Microscopy and Imaging Center (MIC) of the University of Mississippi. Located in the School of Pharmacy, MIC is the core facility providing microscopy and image analysis services for various stakeholders in the North Mississippi region.

Major goals

The aim of this Core is to provide the students, faculty and research staff at the University of Mississippi (UM) with access and training in advanced microscopy techniques.

Presently, the Core provides imaging services of the newly acquired JSM-7200 FLV Field-Emission Scanning Electron Microscope (SEM), funded by the NSF. Additional microscopes will be added to the Core in the future. The new SEM will serve as a shared instrument and support multidisciplinary research programs being conducted in various UM departments. With its high magnification and ultra-high spatial resolution capabilities and multiple detectors, the SEM is a key instrument for several UM departments and supports a number of research programs from fundamental biology research to nanotechnologies, including preparation of gold nanoparticles, nanocomposites, and the study of paleontological nanofossils.


The Microscopy and Imaging Center provides services to students, faculty and researchers on all aspects of light and scanning electron microscopy.

  • Light/optical microscopy
  • Polarizing microscopy
  • Fluorescence microscopy
  • Scanning Electron Microscopy, including:
    • EDS
    • CL
    • STEM
  • Sample preparation for scanning electron microscopy:
    • critical point drying
    • sputter coating
  • Personnel training on sample preparation and microscope operation
  • Demonstration for student groups (max. 10 students/group)



This is an advanced field-emission scanning electron microscope (Model: JSM-7200 FLV manufactured by JEOL) with high magnification (up to x1,000,000) and ultrahigh spatial resolution (up to 1.6 nm) capabilities enabling high quality imaging and analysis of micro and nanostructures. This state-of-the-art FE-SEM is equipped with multiple detectors including Energy Dispersive X-Ray Spectrometer (EDS), Scanning Transmission Electron Microscopy (STEM), Cathodoluminescence (CL), Back-Scattered Electron (BSE), and Secondary Electron (SE) detectors enabling advanced analysis of various sample types.

Specifications of the FE-SEM:

The configuration and technical specification of the scanning electron microscope is given below:

Component Features/Specifications
Microscope This is a high resolution FE-SEM equipped with Low Vacuum (LV) capability
Accelerating voltage 0.01 kV to 30 kV
Probe current 1 pA to 300 nA
Magnification Up to 1,000,000X

1.2 nm at 30 kV

1.2 nm at 15 kV

3.0 nm at 1 kV


The FE-SEM has the following detectors:

1. SE

2. BSE

3. EDS (Oxford AztecEnergy; with 80 mm2 SDD and Advanced level software)

4. STEM (with a resolution of up to 1.2 nm at 30 kV)

5. CL (Deben-Centaurus)



Reservations and related services of the SEM core are facilitated by iLab Core Facility Management Software provided by Agilent Cross Lab. To reserve the SEM, please click the “Reservation” button below. Help articles on scheduling or requesting for services are available at

SEM location

Room #B09-E, Thad Cochran Building-West

National Center for Natural Products Research

School of Pharmacy

The University of Mississippi

University, MS-38677

Core Policies

For instrument reservation, training or related questions contact:

Vijayasankar Raman, Ph.D.

Director for Microscopy and Imaging Center

Room# B05-B, Thad Cochran Building-West

School of Pharmacy

The University of Mississippi

University, MS 38677, USA

P.O. Box 1848

Office: (662) 915-1018

Mobile: (662) 801-3886

Funding Source

The JSM-7200 FLV FESEM was funded in part by the National Science Foundation (NSF) under the Major Research Instrumentation (MRI) program (Award number 1726880).

External links

JEOL-JSM 7200F details

iLab Core Facility Management

Oxford Instruments EDS

National Science Foundation

University of Mississippi

Centaurus CL & BSE Detector

SEM A to Z by JEOL (pdf download)

SEM resources (JEOL)

Denton Vacuum Desk V sputter coater

Deben STEM detector