Microscopy and Imaging Center (SEM Core)
Welcome to the Microscopy and Imaging Center (MIC) of the University of Mississippi. Located in the School of Pharmacy, MIC, also known as the SEM core, is the core facility providing microscopy and image analysis services for various stakeholders in the North Mississippi region.
Major goals
The aim of this Core is to provide the students, faculty and research staff at the University of Mississippi (UM) with access and training in advanced microscopy techniques.
Presently, the Core provides imaging services of the newly acquired JSM-7200 FLV Field-Emission Scanning Electron Microscope (SEM), funded by the NSF. Additional microscopes will be added to the Core in the future. The new SEM will serve as a shared instrument and support multidisciplinary research programs being conducted in various UM departments. With its high magnification and ultra-high spatial resolution capabilities and multiple detectors, the SEM is a key instrument for several UM departments and supports a number of research programs from fundamental biology research to nanotechnologies, including preparation of gold nanoparticles, nanocomposites, and the study of paleontological nanofossils.
Services
SEM Core Policies
The Microscopy and Imaging Center currently provides imaging and training services to students, faculty and researchers on the following:
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- Scanning Electron Microscopy imaging and analysis
- Sample preparation for SEM
- Personnel training on sample preparation and SEM operation
- Demonstration for student groups (max. 10 students/group)
Equipment
JSM-7200 FLV FE-SEM (JEOL)
This is an advanced field-emission scanning electron microscope with high magnification (up to x1,000,000) and ultrahigh spatial resolution (up to 1.6 nm) capabilities enabling high quality imaging and analysis of micro and nanostructures. This state-of-the-art FE-SEM is equipped with multiple detectors including Energy Dispersive X-Ray Spectrometer (EDS), Scanning Transmission Electron Microscopy (STEM), Cathodoluminescence (CL), Back-Scattered Electron (BSE), and Secondary Electron (SE) detectors enabling advanced analysis of various sample types.
Specifications of the FE-SEM:
The configuration and technical specification of the scanning electron microscope is given below:
Component | Features/Specifications |
Microscope | High resolution FE-SEM |
Accelerating voltage | 0.01 kV to 30 kV |
Probe current | 1 pA to 300 nA |
Magnification | Up to 1,000,000X |
Resolution |
1.2 nm at 30 kV 1.0 nm at 15 kV 3.0 nm at 1 kV |
Detectors |
The FE-SEM has the following detectors: 1. Secondary Electron (SE) detector 2. Back-Scattered Electron (BSE) detector 3. Energy Dispersive X-Ray Spectrometer (EDS) detector (Oxford AztecEnergy; 80 mm2 SDD, Advanced system) 4. Scanning Transmission Electron Microscopy (STEM) detector (Deben; motorized annular) 5. Cathodoluminescence (CL) detector (Deben-Centaurus) |
Other features |
1. Low vacuum (LV) capability2. Schottky-type, in-the-lens, thermal field emission gun 3. 5-axis, motorized stage 4. Stage navigation system 5. Chamber scope 6. Windows 10 Professional Operating System 7. Air-cooled water chiller 8. 65″ LCD display 9. Specimen storage 10. Data back-up |
Equipment for sample preparation |
1. Denton Desk-V Sputter Coater (Carbon/platinum coating) 2. Leica CPD 300 Critical Point Dryer |
SEM location
Room #B083, Thad Cochran Building-East
National Center for Natural Products Research
School of Pharmacy
The University of Mississippi
University, MS 38677
Contact Information
For technical assistance, training, and policy related questions contact:
Vijayasankar Raman, Ph.D.
Director of Microscopy and Imaging Center
Room B05-B, Thad Cochran Research Center – West Building
School of Pharmacy
The University of Mississippi
University, MS 38677, USA
P.O. Box 1848
vraman@olemiss.edu
(662) 801-3886
For assistance with scheduling, accounting, and general questions contact:
Melissa King
Administrative Secretary II
Room 113B, Thad Cochran Research Center – West Building
School of Pharmacy
The University of Mississippi
University, MS 38677, USA
P.O. Box 1848
mrk@olemiss.edu
(662) 915-7828
Funding Source
The JSM-7200 FLV FE-SEM was funded in part by the National Science Foundation (NSF) under the Major Research Instrumentation (MRI) program (Award number 1726880).