Microscopy and Imaging Center

University of Mississippi


Blue box graphic with text "SEM Reservation"

JSM-7200FLV Scanning Electron Microscope

This is an advanced field-emission scanning electron microscope (FE-SEM) with high magnification and ultrahigh spatial resolution capabilities enabling high quality imaging and analysis of micro and nanostructures. This state-of-the-art FE-SEM is equipped with multiple detectors including Energy Dispersive X-Ray Spectrometer (EDS), Scanning Transmission Electron Microscopy (STEM), Cathodoluminescence (CL), Back-Scattered Electron (BSE), and Secondary Electron (SE) detectors enabling advanced analysis of various sample types.

SEM Core instrumentation

JSM-7200FLV FE-SEM at the Microscopy and Imaging Center

Specifications of the FE-SEM:

          Accelerating voltage            0.01 kV to 30 kV

          Probe current                        1 pA to 300 nA

          Magnification                        Up to x1,000,000

          Resolution                              Up to 1.2 nm


  1. Secondary Electron (SE) detector
  2. Back-Scattered Electron (BSE) detector
  3. Energy Dispersive X-Ray Spectroscopy (EDS) detector
  4. Scanning Transmission Electron Microscopy (STEM) detector
  5. Cathodoluminescence (CL) detector

Other Features    

  • Low vacuum (LV) capability
  • Schottky-type, in-the-lens, thermal field emission gun
  • 5-axis, motorized stage
  • Stage navigation system
  • Chamber scope
  • 65″ LCD display
  • Specimen storage
  • Data backup
  • Emergency power backup

Denton Desk V TSC Sputter Coater

Denton Vacuum Desk V_TSC sputter coater

The Desk V sputter coater is used in the sample preparation for SEM analysis. This is a fully automated sputter coater, designed for high resolution electron microscopy. It is equipped with metal sputtering (Platinum) as well as carbon evaporation capabilities, oil-free turbo molecular pump, film thickness monitor and tilting/rotating specimen table for uniform coating. The unit is supplied with argon gas.






Leica EM CPD300 Critical Point Dryer

Leica EM CPD300 critical point dryer

Critical point dryer is essential for preparing delicate biological specimens for SEM imaging. The Leica EM CPD300 is an advanced, fully automated unit capable of drying delicate materials for high quality imaging. This unit is supplied with liquid CO2.