Instruments
JEOL JSM-7200FLV Field-Emission Scanning Electron Microscope (FESEM)
This advanced microscope with high magnification and ultrahigh spatial resolution capabilities enables high-quality imaging and analysis of micro and nanostructures. It is equipped with multiple detectors, including an Energy Dispersive X-Ray Spectrometer (EDS), Scanning Transmission Electron Microscopy (STEM), Cathodoluminescence (CL), Back-Scattered Electron (BSE), and Secondary Electron (SE) detectors, enabling advanced analysis of various sample types.
Specifications of the FESEM:
Accelerating voltage 0.01 kV to 30 kV
Probe current 1 pA to 300 nA
Magnification Up to x1,000,000
Resolution Up to 1.2 nm
Detectors
- Secondary Electron (SE) detector
- Everhart-Thornley type in-chamber Lower electron detector (LED), and
- Through-the-lens (TTL)/Upper electron detector (UED)
- Back-Scattered Electron (BSE) detector
- Retractable BE detector (RBED) with COMPO and SHADOW modes
- Energy Dispersive X-Ray Spectroscopy (EDS) detector
- Oxford Instruments X-MaxN 80 EDS with AztecEnergy 5.0 software
- Scanning Transmission Electron Microscopy (STEM) detector
- Deben Retractable motorised Annular STEM, HAADF/MAADF/LAADF/BF, with 12 position STEM converter holder for 3mm TEM grids
- Cathodoluminescence (CL) detector
- Deben Centaurus monochromatic CL detector
Other Features
- Low vacuum (LV) capability
- Gentle Beam (GB) mode
- Charge-free (CF) scan
- Schottky-type thermal field emission gun
- 5-axis, motorized stage
- Trackball, touchpad, mouse and keyboard operation
- Stage navigation system
- Chamber scope
- 65″ LCD display
- Windows 10 Professional Operating System
- Film thickness monitor
- Data backup
- Uninterruptible power supply
Denton Desk V TSC Sputter Coater
The Desk V sputter coater is used to prepare samples for SEM analysis. This fully automated sputter coater is designed for high-resolution electron microscopy. It is equipped with metal sputtering (Platinum) and carbon evaporation capabilities, oil-free turbo molecular pump, film thickness monitor and tilting/rotating specimen table for uniform coating. The unit is supplied with argon gas.
Leica EM CPD300 Critical Point Dryer
A critical point dryer is essential for preparing delicate biological specimens for SEM imaging. The Leica EM CPD300 is an advanced, fully automated unit capable of drying delicate materials for high-quality imaging. This unit uses liquid CO2(critical point 31.1 °C at 1072 psi) as a transitional medium.