Microscopy and Imaging Center
University of Mississippi


Blue box graphic with text "SEM Reservation"

JEOL JSM-7200FLV Field-Emission Scanning Electron Microscope (FESEM)

This advanced microscope with high magnification and ultrahigh spatial resolution capabilities enables high-quality imaging and analysis of micro and nanostructures. It is equipped with multiple detectors, including an Energy Dispersive X-Ray Spectrometer (EDS), Scanning Transmission Electron Microscopy (STEM), Cathodoluminescence (CL), Back-Scattered Electron (BSE), and Secondary Electron (SE) detectors, enabling advanced analysis of various sample types.

SEM Core instrumentation

JEOL JSM-7200FLV FESEM at the Microscopy and Imaging Center

Specifications of the FESEM:

          Accelerating voltage            0.01 kV to 30 kV

          Probe current                        1 pA to 300 nA

          Magnification                        Up to x1,000,000

          Resolution                              Up to 1.2 nm


  1. Secondary Electron (SE) detector
    • Everhart-Thornley type in-chamber Lower electron detector (LED), and
    • Through-the-lens (TTL)/Upper electron detector (UED)
  2. Back-Scattered Electron (BSE) detector
    • Retractable BE detector (RBED) with COMPO and SHADOW modes
  3. Energy Dispersive X-Ray Spectroscopy (EDS) detector
    • Oxford Instruments X-MaxN 80 EDS with AztecEnergy 5.0 software
  4. Scanning Transmission Electron Microscopy (STEM) detector
    • Deben Retractable motorised Annular STEM, HAADF/MAADF/LAADF/BF, with 12 position STEM converter holder for 3mm TEM grids
  5. Cathodoluminescence (CL) detector
    • Deben Centaurus monochromatic CL detector

Other Features    

  • Low vacuum (LV) capability
  • Gentle Beam (GB) mode
  • Charge-free (CF) scan
  • Schottky-type thermal field emission gun
  • 5-axis, motorized stage
  • Trackball, touchpad, mouse and keyboard operation
  • Stage navigation system
  • Chamber scope
  • 65″ LCD display
  • Windows 10 Professional Operating System
  • Film thickness monitor
  • Data backup
  • Uninterruptible power supply

Denton Desk V TSC Sputter Coater

Denton Vacuum Desk V_TSC sputter coater

The Desk V sputter coater is used to prepare samples for SEM analysis. This fully automated sputter coater is designed for high-resolution electron microscopy. It is equipped with metal sputtering (Platinum) and carbon evaporation capabilities, oil-free turbo molecular pump, film thickness monitor and tilting/rotating specimen table for uniform coating. The unit is supplied with argon gas.

Leica EM CPD300 Critical Point Dryer

Leica EM CPD300 critical point dryer

A critical point dryer is essential for preparing delicate biological specimens for SEM imaging. The Leica EM CPD300 is an advanced, fully automated unit capable of drying delicate materials for high-quality imaging. This unit uses liquid CO2(critical point 31.1 °C at 1072 psi) as a transitional medium.