School of Pharmacy

The University of Mississippi

Research Cores

Microscopy and Imaging Center (SEM Core)

Welcome to the Microscopy and Imaging Center (MIC) of the University of Mississippi. Located in the School of Pharmacy, MIC is the core facility providing microscopy and image analysis services for various stakeholders in the North Mississippi region.

Glandular trichome of Cannabis

Picture 2 of 10

Major goals

The aim of this Core is to provide the students, faculty and research staff at the University of Mississippi (UM) with access and training in advanced microscopy techniques.

Presently, the Core provides imaging services of the newly acquired JSM-7200 FLV Field-Emission Scanning Electron Microscope (SEM), funded by the NSF. Additional microscopes will be added to the Core in the future. The new SEM will serve as a shared instrument and support multidisciplinary research programs being conducted in various UM departments. With its high magnification and ultra-high spatial resolution capabilities and multiple detectors, the SEM is a key instrument for several UM departments and supports a number of research programs from fundamental biology research to nanotechnologies, including preparation of gold nanoparticles, nanocomposites, and the study of paleontological nanofossils.

Services

The Microscopy and Imaging Center currently provides imaging and training services to students, faculty and researchers on the following:

    • Scanning Electron Microscopy imaging and analysis
    • Sample preparation for SEM
    • Personnel training on sample preparation and SEM operation
    • Demonstration for student groups (max. 10 students/group)

Equipment

JSM-7200 FLV FE-SEM (JEOL)

This is an advanced field-emission scanning electron microscope with high magnification (up to x1,000,000) and ultrahigh spatial resolution (up to 1.6 nm) capabilities enabling high quality imaging and analysis of micro and nanostructures. This state-of-the-art FE-SEM is equipped with multiple detectors including Energy Dispersive X-Ray Spectrometer (EDS), Scanning Transmission Electron Microscopy (STEM), Cathodoluminescence (CL), Back-Scattered Electron (BSE), and Secondary Electron (SE) detectors enabling advanced analysis of various sample types.

Field-emission scanning electron microscope

Field-emission scanning electron microscope

Specifications of the FE-SEM:

The configuration and technical specification of the scanning electron microscope is given below:

 

Component Features/Specifications
Microscope High resolution FE-SEM
Accelerating voltage 0.01 kV to 30 kV
Probe current 1 pA to 300 nA
Magnification Up to 1,000,000X
Resolution

1.2 nm at 30 kV

1.0 nm at 15 kV

3.0 nm at 1 kV

Detectors

The FE-SEM has the following detectors:

1. SE

2. BSE

3. EDS (Oxford AztecEnergy; 80 mm2 SDD, Advanced system)

4. STEM (Deben; motorized annular, up to 1.2 nm)

5. CL (Deben-Centaurus)

Other features

1. Low vacuum (LV) capability2. Schottky-type, in-the-lens, thermal field emission gun

3. 5-axis, motorized stage

4. Stage navigation system

5. Chamber scope

6. Windows 10 Professional Operating System

7. Air-cooled water chiller

8. 65″ LCD diaplay

9. Specimen storage

10. Data back-up

Equipment for sample preparation

1. Denton Desk-V Sputter Coater (Carbon/platinum coating)

2. Leica CPD 300 Critical Point Dryer

SEM location

Room #B09-E, Thad Cochran Building-East

National Center for Natural Products Research

School of Pharmacy

The University of Mississippi

University, MS-38677

SEM core location map, University of Mississippi School of Pharmacy

UM campus map showing the location of Microscopy and Imaging Center (MIC).

Contact Information

For instrument reservation, training or related questions contact:

Vijayasankar “Vijay” Raman, Ph.D.

Director for Microscopy and Imaging Center (SEM Core)

Room # B05-B, Thad Cochran Building-West

School of Pharmacy

The University of Mississippi

University, MS 38677, USA

P.O. Box 1848

Email: vraman@olemiss.edu

Phone: (662) 801-3886

Funding Source

The JSM-7200 FLV FE-SEM was funded in part by the National Science Foundation (NSF) under the Major Research Instrumentation (MRI) program (Award number 1726880).

External links

JEOL-JSM 7200F details

Oxford Instruments EDS

Deben STEM detector

Centaurus CL & BSE Detector

National Science Foundation

University of Mississippi

SEM A to Z by JEOL (pdf download)

SEM resources (JEOL)

Denton Vacuum Desk V sputter coater